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  • - Episoden aus zwei Leben
    av Michael Haschke
    255,-

  • av Michael Haschke
    1 755,-

    Provides comprehensive coverage on using X-ray fluorescence for laboratory applicationsThis book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results.X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation.* An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses* Focuses on daily laboratory work with commercially available devices* Offers a unique compilation of knowledge and best practices from equipment manufacturers and users* Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained resultsX-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.

  • - Instrumentation and Applications
    av Michael Haschke
    2 129 - 2 149,-

    Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems.

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